X-ray diffraction and ellipsometric studies of zinc sulfide thin films grown by atomic layer epitaxy

Author
Markku Oikkonen
Year
1988
Abstract & Cover
Source of Information
FinALD40 exhibition material, http://www.aldcoe.fi/events/finald40.pdf
University
Helsinki University of Technology, Department of Technical Physics, Laboratory of Physics
(Espoo, Finland)
LinkedIn
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